VLSI Design and Test

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VLSI Design and Test is written by Anirban Sengupta and published by Springer. It's available with International Standard Book Number or ISBN identification 9813297670 (ISBN 10) and 9789813297678 (ISBN 13).

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.