VLSI Design and Test

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VLSI Design and Test is written by S. Rajaram and published by Springer. It's available with International Standard Book Number or ISBN identification 9811359504 (ISBN 10) and 9789811359507 (ISBN 13).

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.