Retroreflex Ellipsometry for Nonplanar Surfaces
- Chen, Chia-Wei
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Know about the book -
Retroreflex Ellipsometry for Nonplanar Surfaces is written by Chen, Chia-Wei and published by KIT Scientific Publishing. It's available with International Standard Book Number or ISBN identification 3731514028 (ISBN 10) and 9783731514022 (ISBN 13).
Retroreflex ellipsometry addresses the geometric restrictions of conventional ellipsometry by using a retroreflective sheet, which returns the light beam from the sample on the same beam path. Simulation and experiments of retroreflex ellipsometry in two- and three-phase systems have been demonstrated based on the proposed concepts, which have shown the capabilities of ellipsometric measurements on nonplanar surfaces.
