VLSI Design and Test

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VLSI Design and Test is written by Manoj Singh Gaur and published by Springer. It's available with International Standard Book Number or ISBN identification 3642420249 (ISBN 10) and 9783642420245 (ISBN 13).

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.