Structural, Syntactic, and Statistical Pattern Recognition

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Structural, Syntactic, and Statistical Pattern Recognition is written by Dit-Yan Yeung and published by Springer. It's available with International Standard Book Number or ISBN identification 3540372415 (ISBN 10) and 9783540372417 (ISBN 13).

This is the proceedings of the 11th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2006 and the 6th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2006, held in Hong Kong, August 2006 alongside the Conference on Pattern Recognition, ICPR 2006. 38 revised full papers and 61 revised poster papers are included, together with 4 invited papers covering image analysis, character recognition, bayesian networks, graph-based methods and more.