Conductive Atomic Force Microscopy(English, Hardcover, unknown)

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Conductive Atomic Force Microscopy(English, Hardcover, unknown) is written by unknown and published by Wiley-VCH Verlag GmbH. It's available with International Standard Book Number or ISBN identification 3527340912 (ISBN 10) and 9783527340910 (ISBN 13).

The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.