Metrology and Standardization for Nanotechnology

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Metrology and Standardization for Nanotechnology is written by Elisabeth Mansfield and published by John Wiley & Sons. It's available with International Standard Book Number or ISBN identification 3527340394 (ISBN 10) and 9783527340392 (ISBN 13).

For the promotion of global trading and the reduction of potential risks, the role of international standardization of nanotechnologies has become more and more important. This book gives an overview of the current status of nanotechnology including the importance of metrology and characterization at the nanoscale, international standardization of nanotechnology, and industrial innovation of nano-enabled products. First the field of nanometrology, nanomaterial standardization and nanomaterial innovation is introduced. Second, major concepts in analytical measurements are given in order to provide a basis for the reliable and reproducible characterization of nanomaterials. The role of standards organizations are presented and finally, an overview of risk management and the commercial impact of metrology and standardization for industrial innovations.