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Defects in Semiconductors I is written by Nickolay T. Bagraev and published by Trans Tech Publications Ltd. It's available with International Standard Book Number or ISBN identification 3035702985 (ISBN 10) and 9783035702989 (ISBN 13).
Proceedings of the 1st National Conference on Defects in Semiconductors (NCDS-1), St. Petersburg, Russia, April 1992