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Proceedings of the TEPEN International Workshop on Fault Diagnostic and Prognostic is written by Bingyan Chen and published by Springer Nature. It's available with International Standard Book Number or ISBN identification 3031702352 (ISBN 10) and 9783031702358 (ISBN 13).
This book gathers the latest advances, innovations, and applications in the field of efficiency and performance engineering, as presented by leading international researchers and engineers at the TEPEN International Workshop on Fault Diagnostics and Prognostics (TEPEN-IWFDP), held in Qingdao, China on May 8–11, 2024. Topics include machine and structural health monitoring, non-destructive testing and fault detection, diagnostic and prognostic for both operational and manufacturing processes, maintenance optimization and asset management, smart metamaterials and metastructures, artificial intelligence, and machine learning. The contributions, which were selected through a rigorous international peer-review process, share exciting ideas that will spur novel research directions and foster new multidisciplinary collaborations.