VLSI Design and Test

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VLSI Design and Test is written by Ambika Prasad Shah and published by Springer Nature. It's available with International Standard Book Number or ISBN identification 3031215141 (ISBN 10) and 9783031215148 (ISBN 13).

This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022. The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.