ToF-SIMS
- J. C. Vickerman
- David Briggs
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Know about the book -
ToF-SIMS is written by J. C. Vickerman and published by IM Publications. It's available with International Standard Book Number or ISBN identification 1906715173 (ISBN 10) and 9781906715175 (ISBN 13).
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive
