Wideband Microwave Materials Characterization

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Wideband Microwave Materials Characterization is written by John W. Schultz and published by Artech House. It's available with International Standard Book Number or ISBN identification 1630819476 (ISBN 10) and 9781630819477 (ISBN 13).

This book is a practical engineering guide to microwave material measurements for both laboratory and manufacturing/field environments, including nondestructive inspection (NDI) and nondestructive evaluation (NDE). The book covers proven methods for characterizing materials at microwave frequencies, including both resonant and wide-bandwidth techniques, and gives you the necessary theory and equations for implementing these methods. You’ll understand how to invert dielectric and/or magnetic material properties from free space transmission and reflection, and how to measure traveling wave attenuation. You’ll also know how to measure dielectric and/or magnetic material properties from transmission line fixtures, and learn how to use computational electromagnetic modeling with a measurement fixture. The book shows you how to build and use microwave NDE equipment for radomes and/or structural dielectric materials. This is an excellent resource for Engineers/scientists conducting or analyzing RF/Microwave/MMW material measurements for applications in electromagnetic materials, as well as those who are developing or applying microwave non-destructive evaluation (NDE) methods to their manufacturing problems.