Microprobe Characterization of Optoelectronic Materials

Know about the book -

Microprobe Characterization of Optoelectronic Materials is written by Juan Jimenez and published by CRC Press. It's available with International Standard Book Number or ISBN identification 1040283829 (ISBN 10) and 9781040283820 (ISBN 13).

Each chapter in this book is written by a group of leading experts in one particular type of microprobe technique. They emphasize the ability of that technique to provide information about small structures (i.e. quantum dots, quantum lines), microscopic defects, strain, layer composition, and its usefulness as diagnostic technique for device degradation. Different types of probes are considered (electrons, photons and tips) and different microscopies (optical, electron microscopy and tunneling). It is an ideal reference for post-graduate and experienced researchers, as well as for crystal growers and optoelectronic device makers.