Speckle Metrology

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Speckle Metrology is written by Sirohi and published by CRC Press. It's available with International Standard Book Number or ISBN identification 1000148165 (ISBN 10) and 9781000148169 (ISBN 13).

This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.