Testing, Reliability, and Application of Micro- and Nano-material Systems IV
- National Science Foundation (U.S.)
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Know about the book -
Testing, Reliability, and Application of Micro- and Nano-material Systems IV is written by National Science Foundation (U.S.) and published by SPIE-International Society for Optical Engineering. It's available with International Standard Book Number or ISBN identification 0819462284 (ISBN 10) and 9780819462282 (ISBN 13).
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
