* Price may vary from time to time.
* GO = We're not able to fetch the price (please check manually visiting the website).
Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California is written by Rochit Rajsuman and published by Institute of Electrical & Electronics Engineers(IEEE). It's available with International Standard Book Number or ISBN identification 0818671025 (ISBN 10) and 9780818671029 (ISBN 13).
This annual workshop serves as a forum for the exchange of ideas on semiconductor memories design and testing. The proceedings of the 1995 workshop include a tutorial session (testing random access memories) and 18 papers in six technical sessions: role of simulation in memory design; bridging fault