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Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California is written by Rochit Rajsuman and published by . It's available with International Standard Book Number or ISBN identification 0818641509 (ISBN 10) and 9780818641503 (ISBN 13).
From the August 1993 workshop in San Jose, California, 26 papers report the latest findings on testing computer memory. The sections include test pattern generation, algorithms, fault models, testing for process defects and yield improvement, and radiation issues and space applications. No subject i