International Workshop on Electronic Design, Test and Applications

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International Workshop on Electronic Design, Test and Applications is written by Michel Renovell and published by Institute of Electrical & Electronics Engineers(IEEE). It's available with International Standard Book Number or ISBN identification 0769514537 (ISBN 10) and 9780769514536 (ISBN 13).

A collection of the 78 oral presentations and 24 poster papers from the January 2002 international workshop which brought together specialists from a broad area of electronic design, manufacturing, test, and advanced system applications in the hope that the conference would integrate design, test, and application as "cross- dependent" disciplines. The contributions are organized into sessions focusing on analog test, communications, digital signal processing and architectures, low to high level fault simulation and identification, high level design, memory, power issues in design and test, sensor and analog design, electrical engineering education, electromagnetics and control, fault-tolerant digital systems, image processing, robotics, submicron technology, test generation and compaction, and test techniques and methodologies. Annotation copyrighted by Book News Inc., Portland, OR