Analytical Techniques for the Characterization of Compound Semiconductors

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Analytical Techniques for the Characterization of Compound Semiconductors is written by G. Bastard and published by Elsevier. It's available with International Standard Book Number or ISBN identification 0444596720 (ISBN 10) and 9780444596727 (ISBN 13).

This volume is a collection of 96 papers presented at the above Conference. The scope of the work includes optical and electrical methods as well as techniques for structural and compositional characterization. The contributed papers report on topics such as X-ray diffraction, TEM, depth profiling, photoluminescence, Raman scattering and various electrical methods. Of particular interest are combinations of different techniques providing complementary information. The compound semiconductors reviewed belong mainly to the III-V and III-VI families. The papers in this volume will provide a useful reference on the implications of new technologies in the characterization of compound semiconductors.