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Transmission Electron Microscopy is written by David B. Williams and published by Springer Science & Business Media. It's available with International Standard Book Number or ISBN identification 038776500X (ISBN 10) and 9780387765006 (ISBN 13).
This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment.