Reliability Analysis and Plans for Successive Testing

Reliability Analysis and Plans for Successive Testing

  • Narayanaswamy Balakrishnan
  • Markos Koutras
  • Fotios Milienos
Publisher:Academic PressISBN 13: 9780128043622ISBN 10: 0128043628

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Reliability Analysis and Plans for Successive Testing is written by Narayanaswamy Balakrishnan and published by Academic Press. It's available with International Standard Book Number or ISBN identification 0128043628 (ISBN 10) and 9780128043622 (ISBN 13).

Reliability Analysis and Plans for Successive Testing: Start-up Demonstration Tests and Applications discusses all past and recent developments on start-up demonstration tests in the context of current numerical and illustrative examples to clarify available methods for distribution theorists and applied mathematicians dealing with control problems. Throughout the book, the authors focus on the panorama of open problems and issues of further interest. As contemporary manufacturers face tremendous commercial pressures to assemble works of high reliability, defined as 'the probability of the product performing its role under the stated conditions and over a specified period of time', this book helps address testing issues. - Unites the tools and methodologies of applied statistics and stochastic modeling to aid the determination of device reliability for better performing consumer goods - Clearly articulates how successive testing methods can be used in practice - Comments not only on distribution sequences closed, but also on open problems and issues of further interest for researchers