VLSI Test Principles and Architectures

Know about the book -

VLSI Test Principles and Architectures is written by Laung-Terng Wang and published by Elsevier. It's available with International Standard Book Number or ISBN identification 0080474799 (ISBN 10) and 9780080474793 (ISBN 13).

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.