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C.H. Stapper

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Diagnostic Measurements In Lsi/vlsi Integrated Circuits Production

Diagnostic Measurements In Lsi/vlsi Integrated Circuits Production

Andrzej Jakubowski, Wieslaw Marciniak and Henryk M Przewlocki

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Defect and Fault Tolerance in VLSI Systems

Defect and Fault Tolerance in VLSI Systems

Israel Koren

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Wafer-Level Integrated Systems

Wafer-Level Integrated Systems

Stuart K. Tewksbury

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Manoj Sachdev and José Pineda de Gyvez

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Integrated Circuit Manufacturability

Integrated Circuit Manufacturability

José Pineda de Gyvez and Dhiraj Pradhan

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Wafer Scale Integration

Wafer Scale Integration

Earl E. Swartzlander Jr.

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Design And Analysis Of Reliable And Fault-tolerant Computer Systems

Design And Analysis Of Reliable And Fault-tolerant Computer Systems

Mostafa I Abd-el-barr

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Fault-Tolerant Systems

Fault-Tolerant Systems

Israel Koren and C. Mani Krishna

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Defect and Fault Tolerance in VLSI Systems

Defect and Fault Tolerance in VLSI Systems

Robert Aitken

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